{"product_id":"precision-measurement-of-microwave-thermal-noise-hardcover","title":"Precision Measurement of Microwave Thermal Noise - Hardcover","description":"\u003cp\u003eby \u003cb\u003eJames Randa\u003c\/b\u003e (Author)\u003c\/p\u003e\u003cp\u003e\u003cb\u003ePrecision Measurement \u003c\/b\u003eof \u003cb\u003eMicrowave\u003c\/b\u003e \u003c\/p\u003e\u003cp\u003e\u003cb\u003eComprehensive resource covering the foundations and analysis of precision noise measurements with a detailed treatment of their uncertainties\u003c\/b\u003e \u003c\/p\u003e\u003cp\u003e\u003ci\u003ePrecision Measurement of Microwave Thermal Noise\u003c\/i\u003e presents the basics of precise measurements of thermal noise at microwave frequencies and guides readers through how to evaluate the uncertainties in such measurement. The focus is on measurement methods used at the U.S. National Institute of Standards and Technology (NIST), but the general principles and methods are useful in a wide range of applications. Readers will learn how to perform accurate microwave noise measurements using the respected author's expertise of calculations to aid understanding of the challenges and solutions. \u003c\/p\u003e\u003cp\u003eThe text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed. \u003c\/p\u003e\u003cp\u003eSpecific topics and concepts covered in the text\u003ci\u003e \u003c\/i\u003einclude: \u003c\/p\u003e\u003cul\u003e\n\u003cli\u003e Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sources\u003c\/li\u003e \u003cli\u003e Amplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategies\u003c\/li\u003e \u003cli\u003e On-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertainties\u003c\/li\u003e \u003cli\u003e Multiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio\u003c\/li\u003e\n\u003c\/ul\u003e \u003cp\u003eContaining some introductory material, \u003ci\u003ePrecision Measurement of Microwave Thermal Noise\u003c\/i\u003e is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.\u003c\/p\u003e\u003ch3\u003eBack Jacket\u003c\/h3\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cb\u003eComprehensive resource covering the foundations and analysis of precision noise measurements with a detailed treatment of their uncertainties\u003c\/b\u003e \u003c\/p\u003e\u003cp\u003e\u003ci\u003ePrecision Measurement of Microwave Thermal Noise\u003c\/i\u003e presents the basics of precise measurements of thermal noise at microwave frequencies and guides readers through how to evaluate the uncertainties in such measurement. The focus is on measurement methods used at the U.S. National Institute of Standards and Technology (NIST), but the general principles and methods are useful in a wide range of applications. Readers will learn how to perform accurate microwave noise measurements using the respected author's expertise of calculations to aid understanding of the challenges and solutions. \u003c\/p\u003e\u003cp\u003eThe text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed. \u003c\/p\u003e\u003cp\u003eSpecific topics and concepts covered in the text\u003ci\u003e \u003c\/i\u003einclude: \u003c\/p\u003e\u003cul\u003e\n\u003cli\u003e Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sources\u003c\/li\u003e \u003cli\u003e Amplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategies\u003c\/li\u003e \u003cli\u003e On-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertainties\u003c\/li\u003e \u003cli\u003e Multiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio\u003c\/li\u003e\n\u003c\/ul\u003e \u003cp\u003eContaining some introductory material, \u003ci\u003ePrecision Measurement of Microwave Thermal Noise\u003c\/i\u003e is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.\u003c\/p\u003e\u003ch3\u003eAuthor Biography\u003c\/h3\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003e\u003cb\u003eJames Randa\u003c\/b\u003e received the Ph.D. degree in Theoretical Physics from the University of Illinois at Urbana-Champaign, USA. After a series of postdoctoral and temporary faculty positions, he joined NIST, where he worked for about 25 years, leading the Noise Project for much of that time. Since his retirement he has continued to work on topics in noise on a part-time basis, as a contractor and\/or a guest researcher at NIST. He is a Senior Member of the IEEE.\u003c\/p\u003e\u003cdiv\u003e\n\u003cstrong\u003eNumber of Pages:\u003c\/strong\u003e 176\u003c\/div\u003e\u003cdiv\u003e\n\u003cstrong\u003eDimensions:\u003c\/strong\u003e 0.44 x 9 x 6 IN\u003c\/div\u003e\u003cdiv\u003e\n\u003cstrong\u003ePublication Date:\u003c\/strong\u003e November 23, 2022\u003c\/div\u003e","brand":"Books by splitShops","offers":[{"title":"Default Title","offer_id":42157232390279,"sku":"9781119910091","price":180.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0601\/2623\/2711\/files\/1d9ebc8c8ae0f80992d1cad6226a5ba3.webp?v=1733249526","url":"https:\/\/booksby.splitshops.com\/products\/precision-measurement-of-microwave-thermal-noise-hardcover","provider":"Books by splitShops","version":"1.0","type":"link"}